Eur. Phys. J. E 27, 421-424 (2008)
DOI: 10.1140/epje/i2008-10405-5

Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations

B. Gompf¹, D. Faltermeier¹, C. Redling¹, M. Dressel¹ and J. Pflaum<sup>2

1</sup>  1. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany
²  3. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany

gompf@pi1.physik.uni-stuttgart.de

Received 19 June 2008 / Revised version 1 October 2008 / Published online 19 December 2008

Abstract

X-ray diffraction, atomic force microscopy and spectroscopic ellipsometry were used to study tetracene thin films as a function of deposition rate. A comparative analysis of the thickness and roughness values allows for detailed modelling of the film morphology. An interdigitated growth mode is established for the coexisting thin film and bulk phases. By comparison with the respective quinone-derivative of tetracene, we were additionally able to identify reaction products by their optical response.

PACS
68.55.-a - Thin film structure and morphology.
68.55.am - Polymers and organics.
78.66.Qn - Polymers; organic compounds.

Correspondence: gompf@pi1.physik.uni-stuttgart.de


© EDP Sciences, Società Italiana di Fisica, Springer-Verlag 2008

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